The purpose of this study is to elucidate the origin of the additional response signals arising from the surface topography of samples during piezoresponse force microscopy (PFM) measurements. Periodic mountain-shaped protrusions with triangular cross-sections were fabricated on the surface of a silicon single crystal. a material with no inherent piezoelectricity. and PFM measurements... https://www.danddcollectiblers.shop/product-category/picture-frames/